Since 2003 our group at the Physics Institute of the University of São Paulo has been working on the characterization and analysis of various materials using Ion Beam Analysis (IBA). Initially we used traditional IBA techniques like Particle Induced X-Ray Emission (PIXE) and Rutherford Backscattering Spectrometry (RBS), but we have also incorporated Ion Beam Induced Luminescence (IBIL) to determine elements and chemical compounds in surface layers. Recently, we expanded the possibilities of analysis by improving a 3D robotic setup that was coupled to the external beam line. Due to the good resolution of this device it is possible to produce elemental mapping of large areas with high accuracy and reproducibility, in particular to perform analysis of cultural heritage objects. Our group also employs a mobile laboratory to study cultural heritage objects in situ, e.g. at museums. In this seminar I will discuss the IBA techniques showing some of our results using this kind of analysis. Examples of the applications with the mobile equipment will also be presented.